Mount:

1/4-20 thread

Dimensions (mm):

60.96 x 67.31 x 66.17

Signal to Noise S/N Ratio (dB):

1‚000:1

Spectral Range:

190 - 1150

Dimensional Accuracy:

±1µm

Maximum Power (W):

1 W Total & 0.5 mW/µm²

Frame Rate:

5Hz

Beam Diameter (μm):

2µm to 4mm

Regulatory Compliance

RoHS 2015:

Exempt

Certificate of Conformance:

View

REACH 241:

Contains SVHC(s)

Product Family Description

Designed For Use From 190 to 1150nm
Measure Beam Diameters of 2µm to 4mm
Robust Easy to Use Software Provided

DataRay Scanning Slit Beam Profilers feature a silicon detector making it perfect for a 190 to 1150nm spectral range. Equipped with 2.5µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters down to 2µm. Scanning slit instruments offer much higher resolution than camera-based systems, and are compatible with both continuous wave and pulsed laser sources. DataRay Scanning Slit Beam Profilers are ideal for optical assembly and instrument alignment, real-time diagnosis of focusing and alignment errors, real-time setting of multiple assemblies to the same focus. These profilers are USB 2.0 powered and include a 3m USB 2.0 cable.

BeamR2-Si Scanning Slit Beam Profiler

Regulatory Compliance

Product Family Description