Sub-angstrom surface roughness metrology with the white light interferometer"
Shawn Iles and Jayson Nelson
SPIE
11/15/2019 5:00:00 AM
https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11175/1117519/Sub-angstrom-surface-roughness-metrology-with-the-white-light-interferometer/10.1117/12.2536683.full
or view regional numbers
QUOTE TOOL
enter stock numbers to begin
Copyright 2023, Edmund Optics India Private Limited, #267, Greystone Building, Second Floor, 6th Cross Rd, Binnamangala, Stage 1, Indiranagar, Bengaluru, Karnataka, India 560038
California Consumer Privacy Acts (CCPA): Do Not Sell or Share My Personal Information
California Transparency in Supply Chains Act